How Scientists Capture Atomic-Scale Images of Fragile Materials
Radiation-sensitive materials include some of the most technologically promising compounds of our time. Metal-organic frameworks (MOFs) possess cage-like structures with enormous surface areas, making them ideal for carbon capture, hydrogen storage, and catalytic applications. Organic-inorganic halide perovskites can convert sunlight to electricity with remarkable efficiency, promising to revolutionize solar energy technologies 5 .
The damaging interaction between electrons and sensitive materials occurs through several mechanisms:
The breakthrough of aberration correction has been transformative for electron microscopy. In traditional TEM, lens imperfections—particularly spherical aberration—blurred images and limited resolution 3 .
The implementation of correctors—sophisticated arrangements of magnetic elements that compensate for these imperfections—has enabled resolutions down to 50 picometers (0.5 Ångstroms), allowing direct visualization of atomic columns 3 8 .
Aspect | Traditional TEM | Aberration-Corrected TEM | Benefit for Sensitive Materials |
---|---|---|---|
Resolution | Limited to ~1.5-2 Å | Can reach ~0.5 Å | More information from fewer electrons |
Contrast delocalization | Significant (>5 Å) | Minimal (<1 Å) | Clearer images without artifactual spreading |
Optimal defocus | Scherzer defocus only | Multiple options available | Greater flexibility in imaging conditions |
Depth sensitivity | Limited | Improved sectioning capability | Better 3D information from single images |
The fundamental strategy for imaging radiation-sensitive materials is minimizing total electron exposure. This requires a complete rethinking of traditional TEM approaches, implementing what researchers call "low-dose microscopy."
The concept involves:
A revolutionary technique that uses nearly all available signal, extracting more information from fewer electrons 1 .
A groundbreaking 2025 study published in Nature Communications demonstrated that electron ptychography could achieve near-atomic resolution (~2 Å) on extremely radiation-sensitive metal-organic frameworks at doses as low as ~100 e⁻/Ų 1 .
This represented a watershed moment for the field, as it pushed electron ptychography into a dose regime previously thought impossible for high-resolution imaging.
A 300 kV aberration-corrected TEM equipped with a hybrid pixel array detector (EMPAD)
A defocused probe with precise control of convergence angle
256 × 256 probe positions with a relatively large step size of 1.05 Å
Extremely low beam current (<0.02 pA) despite the detector's limited frame rate
Parameter | Value | Significance |
---|---|---|
Accelerating voltage | 300 kV | Standard high-voltage setting for atomic-resolution TEM |
Probe current | <0.02 pA | Extremely low current to limit dose |
Total dose | ~100 e⁻/Ų | Pushes into previously impossible regime for high-resolution |
Convergence semi-angle | 10 mrad | Optimal for low-dose reconstruction identified through simulation |
Scan points | 256 × 256 | Sufficient sampling for quality reconstruction |
Recording diffraction patterns with high quantum efficiency, low noise, and fast readout 1 .
Sample cooling reduces radiation damage and minimizes contamination 4 .
Sample support with minimal background and high stability 9 .
Precisely controls electron flux to minimize sample damage 1 .
Extracts maximum information from limited data through advanced processing 1 .
With the move to lower doses, images become noisier, necessitating sophisticated computational approaches to extract meaningful information 1 .
The future of sensitive materials imaging lies in increased automation and artificial intelligence. Researchers have developed systems that automate data collection, transfer, and processing, allowing large amounts of data to be collected over wide areas without human intervention 9 .
The most advanced microscopy facilities now function as integrated research infrastructures, combining microscopes with high-performance computing resources for real-time data processing. Systems can now stream data directly from microscopes to supercomputers at rates up to 14 times faster than conventional file transfers 9 .
There is growing interest in combining low-dose techniques with cryo-microscopy and in situ observations. Advanced microscope designs feature triple anticontamination designs that allow for long cryogenic experiments with minimal contamination (2 nm/hour), opening possibilities for studying biological materials and dynamic processes in liquids or gases 4 .
The development of strategies for high-resolution imaging of radiation-sensitive materials represents one of the most significant advances in electron microscopy in recent decades. By combining aberration correction, sophisticated dose control, revolutionary imaging techniques like ptychography, and advanced computational methods, scientists can now visualize atomic structures that were previously too fragile to study.
These advances are not merely technical triumphs—they open new windows into materials critical for addressing global challenges in energy, environment, and health. As these techniques continue to evolve and become more accessible, we can expect to see even more remarkable images of the previously unseeable, further expanding the boundaries of what we can understand and ultimately create at the atomic scale.